Work

Disentangled Knowledge Distillation for Unified Multi-Class Anomaly Detection

Year: 2024

Type: conference-paper

Source: Proceedings - International Conference on Image Processing

DOI: 10.1109/icip51287.2024.10647795

Authors: Jiyong Jang, Hayeon Lee, Younkwan Lee

Institutions: Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: Anomaly Detection Techniques and Applications

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402915567

FWCI: 0.588

Cites: 24

Cited by: 2

Related to: 10