Year: 2024
Type: conference-paper
Abstract: The application of deep learning in visual anomaly detection has gained widespread popularity due to its potential use in quality control and manufacturing. Current standard methods are Unsupervised, where a clean dataset is utilised to detect deviations and flag anomalies during testing. However, incorporating a few samples when the type of anomalies is known beforehand can significantly enhance performance. Thus, we propose ATAC-Net, a framework that trains to detect anomalies from a minimal set of known prior anomalies. Furthermore, we introduce attention-guided cropping, which provides a closer view of suspect regions during the training phase. Our framework is a reliable and easy-to-understand system for detecting anomalies, and we substantiate its superiority to some of the current state-of-the-art techniques in a comparable setting.
Authors: Shaurya Gupta, Neil Gautam, Anurag Malyala
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4402915936