Thin film uniformity detection of solar wafers based on improved DeepLab v3+ and infrared thermal imaging technology
Year: 2024
Type: conference-abstract
DOI: 10.1117/12.3050688
Authors: Yongping Zhang, Jiandong Bao, Lijun Huo, Guoping Zhai, Yingying Wang
Institution: Nanjing University of Science and Technology
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4402921823