Work

Defect-Free SiGe/Si Multistacks for Next-Generation CFET Architectures

Year: 2024

Type: conference-paper

Source: ECS Transactions

DOI: 10.1149/11402.0047ecst

Authors: Gianluca Rengo, Daniel Casey, Brendan Marozas, Niels Claessens, Rami Khazaka

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4402931392

FWCI: 2.418

Cites:

Cited by: 3

Related to: 10