Correlations of interface charge accumulation and device characteristics studied by DCM-PL technique
Year: 2024
Type: conference-paper
DOI: 10.1117/12.3027233
Authors: Yutaka Noguchi, Mihiro Takeda, Shotaro Nakano, Alexander Hofmann, Wolfgang Bruetting
Institutions: Meiji University, University of Augsburg
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4402976208
