Work

Investigating the Arc-Shaped Kink Drain Voltage of Drain Current With Capacitance-Voltage Measurement Method in GaN HEMTs

Year: 2024

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2024.3467344

Authors: Jui-Tse Hsu, Shawn S. H. Hsu, Ting-Chang Chang, Chen-Hsin Lien, Ting-Tzu Kuo, Chien-Hung Yeh, Jia-Hong Lin, Ya-Huan Lee, Cheng-Hsien Lin, Wei-Chieh Hung, I-Yu Huang

Institutions: National Tsing Hua University, National Sun Yat-sen University

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: National Science and Technology Council

Awards: G7070869566, G797938675

OpenAlex ID: W4402978148

FWCI:

Cites: 28

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Related to: 10