Work

Reliability of Tunneling Regime for Silicon on Insulator-Based Neuron

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3462377

Authors: Shubham Patil, Abhishek Kadam, Rashmi Saikia, Jay Sonawane, Karansingh Thakor, Ajay Kumar Singh, R. Gaurav, Nihar Ranjan Mohapatra, Sandip Lashkare, Veeresh Deshpande, Udayan Ganguly

Institutions: Indian Institute of Technology Bombay, Indian Institute of Technology Gandhinagar

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Department of Science and Technology, Philippines

OpenAlex ID: W4402980213

FWCI: 0.205

Cites: 34

Cited by: 2

Related to: 10