Work

Reliability Impacts Among Neighboring Wordlines on 3D QLC NAND Flash

Year: 2024

Type: conference-paper

DOI: 10.1109/nvmsa63038.2024.10693657

Authors: Junlong Zhu, Zheng Wan, Hongyang Dang, Kan Zhong, Min Ye, Qiao Li, Chun Jason Xue

Institutions: Xiamen University, Chongqing University, Mohamed bin Zayed University of Artificial Intelligence

Language: English

Topic: Advanced Data Storage Technologies

Subfield: Computer Networks and Communications

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Fundamental Research Funds for the Central Universities

Awards: G2692999226, G672921438

OpenAlex ID: W4402981673

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