Work

In situ, non-invasive novel measurement method for the determination of integrated waveguide losses

Year: 2024

Type: conference-paper

Source: Metamaterials, Metadevices, and Metasystems

DOI: 10.1117/12.3028025

Authors: Michael Hack, Bennet Kugler, Maurice Wanitzek, Ponraj Vijayan, Jörg Schulze, Michael Oehme

Institutions: University of Stuttgart, Friedrich-Alexander-Universität Erlangen-Nürnberg

Language: English

Topic: Photonic and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403052674

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