Corrosion and conductivity damage of AgNW transparent conductive thin films under a simulated sulfur-containing atmosphere and mechanical force
Year: 2024
Type: article
Source: Microelectronics Reliability
Authors: Shan Wan, Tingting Wen, Bokai Liao, Xingpeng Guo
Institution: Guangzhou University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403052997