Cyclic shift short-distance attention for defect detection of fine etching mesh
Year: 2024
Type: article
Source: Engineering Research Express
Authors: Yuehao Zou, Shengrong Long, Zhinong Li, Faqiang Chen
Institution: Nanchang Hangkong University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403054870