Work

Data quality in laboratory convergent-beam X-ray total scattering

Year: 2024

Type: article

Source: Journal of Applied Crystallography

DOI: 10.1107/s1600576724008355

Authors: Peter C. Metz, Michael R. Koehler, Katharine Page

Institutions: University of Tennessee at Knoxville, Oak Ridge National Laboratory

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: DEVCOM Army Research Laboratory

Award: G1745288795

OpenAlex ID: W4403055427

FWCI: 0.19

Cites: 60

Cited by: 2

Related to: 10