Work

On-State Voltage Measurement Circuit for Condition Monitoring of MOSFETs in Resonant Converters

Year: 2024

Type: article

Abstract: This work aims to estimate the Metal-Oxide-Semiconductor Field-Effect Transistor’s (MOSFET) junction temperature, guessing in real time the dynamic drain-source resistance during MOSFET operation in LLC (Inductor-Inductor-Capacitor) converters usually adopted in Switched-Mode Power Supplies. The task is accomplished using an on-state voltage measurement circuit that allows clamping of the high-voltage drain-source voltage during the off-state. The results of this method have been compared with the temperature accurately measured using a co-packed die as a thermal sensor.

Source: Electronics

DOI: 10.3390/electronics13193902

Authors: Marco Ventimiglia, Alfio Scuto, Giuseppe Sorrentino, Gaetano Belverde, Francesco Iannuzzo, Santi Agatino Rizzo

Institutions: STMicroelectronics (Italy), Aalborg University, University of Catania

Language: English

Topic: Advanced DC-DC Converters

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: gold

Estimated APC paid: $2,728

OpenAlex ID: W4403071573

FWCI: 0.208

Cites: 29

Cited by: 2

Related to: 10