Work

Analysis of laser-induced contamination in the sub-picosecond UV regime and its consequences on laser beam quality in the context of industrial applications

Year: 2024

Type: conference-paper

Abstract: International audience

Source: SPIE Laser Damage Symposium: Laser-Induced Damage in Optical Materials

DOI: 10.1117/12.3032734

Authors: Jules Herbuvaux, Frank Wagner, Luis Alonso Vazquez-Zuniga, Serge Monneret, Clemens Hoenninger, Julien Nillon, Laurent Gallais

Institutions: Institut Fresnel, Amplitude Systèmes (France)

Language: English

Topic: Laser Material Processing Techniques

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W4403086687

FWCI:

Cites: 7

Cited by:

Related to: 10