Work

High Efficient Automatic Test Method for SIP Products

Year: 2024

Type: conference-paper

DOI: 10.1109/aces-china62474.2024.10699798

Authors: Tao Li, Zehong Yan, Pei Liu

Institutions: Xidian University, China Electronics Technology Group Corporation

Language: English

Topic: Electronic Packaging and Soldering Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403123498

FWCI:

Cites: 2

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Related to: 10