Multiphysics Modeling and Characterization of Resistive Random Access Memory Device
Year: 2024
Type: conference-paper
Authors: Yanyan Qian, Shang Li, Zhengwen Liao, Shihao Ma, Ting Wan
Institution: Nanjing University of Posts and Telecommunications
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403124296
