Work

Electrothermal Effects on Hot-Carrier Reliability of FinFETs in Ring Oscillators Based on Equivalent Thermal Model

Year: 2024

Type: conference-paper

DOI: 10.1109/aces-china62474.2024.10699812

Authors: Zongyu Chen, Wenchao Chen

Institution: Zhejiang University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

OpenAlex ID: W4403124501

FWCI: 0.806

Cites: 8

Cited by: 1

Related to: 10