Work

A Remaining Useful Life Prediction Method for Insulated-Gate Bipolar Transistor Based on Deep Fusion of Nonlinear Features From Multisource Data

Year: 2024

Type: article

Source: IEEE Sensors Journal

DOI: 10.1109/jsen.2024.3471675

Authors: Gaige Chen, Xiaoyu Hao, Jun Huang, Hongbo Ma, Xianzhi Wang, Xianguang Kong

Institutions: Xi’an University of Posts and Telecommunications, Xidian University

Language: English

Topic: Machine Fault Diagnosis Techniques

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G3836274313, G4324543583, G6614269455, G8039089062

OpenAlex ID: W4403182153

FWCI: 0.787

Cites: 33

Cited by: 5

Related to: 10