Work

Evolution of Point Defects in Chip-Level Silicon-Based MOSFET Under Transmission Line Pulse Stress

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3466840

Authors: Xinyuan Zheng, Huiying Li, Yibo Ning, Chengbing Pan, Kai Wang, Lixia Zhao

Institution: Tiangong University

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G8036478532

OpenAlex ID: W4403183053

FWCI: 0.312

Cites: 28

Cited by: 3

Related to: 10