Work

Multi-view terahertz and infrared imaging sheets for non-destructive inspection

Year: 2024

Type: conference-paper

Source: Industrial Optical Devices and Systems (ODS)

DOI: 10.1117/12.3029587

Author: Yukio Kawano

Institution: Chuo University

Language: English

Topic: Terahertz technology and applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403205822

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