One-Step Method of Dynamic Capacitances Extraction From a SiC Power MOSFET in a Half-Bridge Package for EMI Analysis
Year: 2024
Type: article
Authors: Jaewon Rhee, Sanguk Lee, Changmin Lee, Seongho Woo, Hongseok Kim, Jiseong Kim, Seungyoung Ahn
Institution: Korea Advanced Institute of Science and Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403210223