Work

An Efficient and Cost-effective Method to Detect and Analyze ESD CDM Risks in Designs

Year: 2024

Type: conference-paper

Source: Annual EOS/ESD Symposium (EOS/ESD)

DOI: 10.23919/eos/esd61719.2024.10702132

Authors: Subhadeep Ghosh, Kaustav Ray, Raj Sankaralingam, Rith Pok

Institutions: Texas Instruments (India), Texas Instruments (United States)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403210676

FWCI:

Cites: 10

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Related to: 10