Work

On-Chip ESD Protection for Multi-Gbps Automotive Serial IO in a 16-nm FinFET Process

Year: 2024

Type: conference-paper

Source: Annual EOS/ESD Symposium (EOS/ESD)

DOI: 10.23919/eos/esd61719.2024.10702100

Authors: Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum

Institutions: University of Illinois Urbana-Champaign, Analog Devices (United States)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403210682

FWCI: 3.906

Cites: 10

Cited by: 5

Related to: 10