Work

Substrate NPN Extraction from Capacitance Field Solver

Year: 2024

Type: conference-paper

Source: Annual EOS/ESD Symposium (EOS/ESD)

DOI: 10.23919/eos/esd61719.2024.10702111

Authors: Chuan Xu, Michael Rivard, Yuanqing Zhu, William Liu

Institution: Analog Devices (United States)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403210860

FWCI:

Cites: 3

Cited by:

Related to: 10