Work

Influence of TVS Properties and Printed Circuit Board Design on System Level ESD Robustness for USB-C SuperSpeed data lines

Year: 2024

Type: conference-paper

Source: Annual EOS/ESD Symposium (EOS/ESD)

DOI: 10.23919/eos/esd61719.2024.10702133

Authors: Steffen Holland, Nima Lotfi, Martin Pilaski, Burkhard Laue, Stefan Seider

Institution: NXP (Germany)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403211496

FWCI:

Cites: 6

Cited by:

Related to: 10