The Demand for a CDM Bare Die Testing Method
Year: 2024
Type: conference-paper
Authors: Lena Zeitlhoefler, Theresa Lutz, Friedrich Zur Nieden, Kai Esmark, Reinhold Gaertner
Institution: Infineon Technologies (Germany)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403211717