Work

Can CC-TLP be used as an early Failure Analysis tool?

Year: 2024

Type: conference-paper

Source: Annual EOS/ESD Symposium (EOS/ESD)

DOI: 10.23919/eos/esd61719.2024.10702149

Authors: Chloe Troussier, Johan Bourgeat, Blaise Jacquier

Institution: STMicroelectronics (France)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403211795

FWCI:

Cites: 5

Cited by:

Related to: 10