Work

A Statistical Explanation of CDM Qualification Variability

Year: 2024

Type: conference-paper

Source: Annual EOS/ESD Symposium (EOS/ESD)

DOI: 10.23919/eos/esd61719.2024.10702104

Authors: Theo Smedes, Wolfgang Scheucher, Sheela Verwoerd, Joop Verwijst

Institution: NXP (Netherlands)

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403211963

FWCI:

Cites: 7

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Related to: 10