Investigation of ferro-resistive switching mechanisms in TiN/Hf0.5Zr0.5O2/WOx/W ferroelectric tunnel junctions with the interface layer effect
Year: 2024
Type: article
Source: Applied Physics Reviews
DOI: 10.1063/5.0224203
Institutions: Seoul National University, Ajou University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G7208142174
OpenAlex ID: W4403216783
