A grey incidence-based algorithm for optimization of accelerated degradation test
Year: 2024
Type: article
Authors: Weikang Zhang, Huiru Gu, Sainan Wu, Shusen Zhong, Jing Yang, Huiqin Luan, Qi Li
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403221769