Work

Drift of Combinational Circuits Failure Rates with a Probabilistic Model Approximated by Partitioning

Year: 2024

Type: conference-paper

DOI: 10.1109/sbcci62366.2024.10704004

Authors: Esther Goudet, Luis H. Peña Treviño, Gutemberg Goncalves Dos Santos, Sayah El Hajji, Fabio Sureau, Lirida Naviner, Jean-Marc Daveau, Philippe Roche

Institutions: Laboratoire Traitement et Communication de l’Information, Universidade Federal de Campina Grande, Centre National de la Recherche Scientifique, Institut de Physique de Rennes, Université de Rennes, STMicroelectronics (France), Institut Polytechnique de Paris

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403278970

FWCI:

Cites: 12

Cited by:

Related to: 10