Work

Techniques for Exploring Fine-Grained LUT and Routing Aging on a 28nm FPGA

Year: 2024

Type: conference-paper

Source: International Conference on Field Programmable Logic and Applications (FPL)

DOI: 10.1109/fpl64840.2024.00033

Authors: Hayden Cook, Jeffrey Goeders

Institution: Brigham Young University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W4403279674

FWCI:

Cites: 28

Cited by:

Related to: 10