Nickel oxide films with the zinc blende-type structure – A re-evaluation of X-ray diffraction data
Year: 2024
Type: article
Abstract: The previously unobserved formation of zinc blende-type structured nickel oxide films (NiO 1.2 ) was discovered by the re-evaluation of X-ray powder diffraction data. Nickel oxide films were synthesized by deposition of nickel together with activated oxygen at substrate temperatures of 83 K and 298 K. At 83 K, amorphous NiO films are formed, which crystallize at around 473 K forming the rock salt-type structure. In contrast, films deposited at 298 K are polycrystalline and form the zinc blende-type structure. Both structures have largely identical lattice parameters with the same nickel fcc sublattice , but with either tetrahedral or octahedral sites filled with oxygen atoms. The only difference observed between the X-ray powder patterns is the intensity of the reflections. The calculation of X-ray difference maps was decisive in distinguishing between the two structures. The Ni-O distances in the zinc blende structure are 181 pm, confirming the presence of Ni III in the NiO 1.2 film.
Source: Materials Today Communications
Author: Dieter Fischer
Institution: Max Planck Institute for Solid State Research
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $2,430
OpenAlex ID: W4403287406