Work

Total-Ionizing-Dose Tolerant SCR Devices With High Holding Voltage for ESD Protection

Year: 2024

Type: article

Source: IEEE Electron Device Letters

DOI: 10.1109/led.2024.3477452

Authors: Yujie Liu, Ke Zhang, Yansen Liu, Xiaonian Liu, Xiangliang Jin

Institution: Hunan Normal University

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Hunan Province

Awards: G4520234247, G4993011063, G8625704283

OpenAlex ID: W4403295596

FWCI: 0.208

Cites: 18

Cited by: 2

Related to: 10