Work

A New Improved YOLO Based Network for PCB Surface Defect Detection

Year: 2024

Type: conference-paper

Source: International Conference on Data-driven Optimization of Complex Systems (DOCS)

DOI: 10.1109/docs63458.2024.10704423

Authors: Yihong Fei, Binyang Xie, Jingya Zhang, Yixin Jin, Ziyi Pan, Chenyue Yuan

Institution: Suzhou University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403295739

FWCI: 2.882

Cites: 27

Cited by: 4

Related to: 10