Study on contrast response and detecting performance of machine vision system
Year: 2024
Type: conference-paper
DOI: 10.1117/12.3036430
Authors: Yikang Gong, Wende Liu, HaiYong Gan, Yuanrui Dong, Zhe Peng, Zuo Chen
Institution: National Institute of Metrology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403326587