Work

Four-Port Probe for Simultaneous Measurement of Electric and Magnetic Fields in Near-Field Scanning

Year: 2024

Type: article

Source: IEEE Sensors Journal

DOI: 10.1109/jsen.2024.3472568

Authors: Lei Wang, Quan Huang, Tao Zhang, Wenxiao Fang, Zhangming Zhu

Institutions: China Electronic Product Reliability and Environmental Test Institute, Xidian University, Sun Yat-sen University

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G6582672752

OpenAlex ID: W4403331583

FWCI: 1.145

Cites: 51

Cited by: 11

Related to: 10