Robust Unsupervised Anomaly Detection for Surface Defects Based on Stacked Broad Learning System
Year: 2024
Type: article
Authors: Xiaojia Wang, Wenjing Bian, Xibin Zhao
Institutions: Hefei University of Technology, Tsinghua University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G2726607037, G4296192525, G760460541
OpenAlex ID: W4403331686