Optimization of phase noise testing algorithm for extremely narrow linewidth
Year: 2024
Type: conference-paper
DOI: 10.1117/12.3039761
Authors: Xu Ding, Xuanyi Zhang, FangXing Zhang
Institutions: Shanghai Maritime University, Peking University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403333170