A Hybrid Mechanism and Data‐Driven Approach for Predicting Fatigue Life of MEMS Devices by Physics‐Informed Neural Networks
Year: 2024
Type: article
DOI: 10.1111/ffe.14465
Authors: Jiaxing Cheng, Junxi Lu, Bangjian Liu, Jing An, Anping Shen
Institutions: Yangzhou University, Yancheng Institute of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403353884