Deep Information Retention Network‐Enabled Data Modeling for Key Quality Indicator Prediction in the Chemical Industry
Year: 2024
Type: article
Source: Journal of Chemometrics
DOI: 10.1002/cem.3605
Authors: Jiang Luo, Yalin Wang, Chenliang Liu, Xiaofeng Yuan, Kai Wang
Institution: Central South University
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G4144683321, G74403156
OpenAlex ID: W4403377194
