Nelder–Mead Optimization of Dual-Wave EMAT for Defect Recognition With Grey Relational Analysis
Year: 2024
Type: article
Source: IEEE Sensors Journal
Authors: Ting Zhang, Jieping Wu, Jiahao Zou, Wentao Peng, Xiaoqing Yang
Institution: Sichuan University
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G4330234728, G610110112
OpenAlex ID: W4403390270
