Exploring Initiation-Growth Correlation in Accelerated Degradation Testing Data: Both Classical and Bayesian Approaches
Year: 2024
Type: article
Source: IEEE Transactions on Reliability
Authors: Guanqi Fang, Rong Pan, Yizi Wang, Haili He, Weiqin Yu
Institutions: Zhejiang Gongshang University, Arizona State University
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403391426
