Work

Research on optimization method of scanner measurement based on cluster analysis

Year: 2024

Type: conference-paper

DOI: 10.1117/12.3036549

Authors: Xiaolei Hu, Yu Ren, Feng Zhang, Chen Xue

Institution: Shanghai Institute of Measurement and Testing Technology

Language: English

Topic: Advanced Measurement and Metrology Techniques

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403392973

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