Work

Study on calibration method of EMCCD readout noise at high gain

Year: 2024

Type: conference-paper

DOI: 10.1117/12.3036351

Authors: Ruobing Li, Hui Zhao, Yue PAN, Mingyang Yang, Baopeng Li, Xuewu Fan

Institutions: Xi'an Technological University, Xi'an Institute of Optics and Precision Mechanics

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403392999

FWCI: 0.806

Cites: 2

Cited by: 1

Related to: 10