Work

A Robust Power Loss Observer for Thermal Model Method-Based IGBT Junction Temperature Monitoring

Year: 2024

Type: article

Source: Protection and Control of Modern Power Systems

DOI: 10.23919/pcmp.2024.000066

Authors: Ye Tian, Bowen Liu, Kaiyang Bu, Chushan Li, Shuoyu Ye, Wuhua Li, Haoze Luo, Xiangning He

Institutions: Zhejiang University, University of Illinois Urbana-Champaign

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, National Key Research and Development Program of China, Key Research and Development Program of Zhejiang Province

Awards: G2438750597, G3436361674, G8541710811

OpenAlex ID: W4403447492

FWCI: 0.312

Cites: 48

Cited by: 3

Related to: 10