Work

AttSwin-YOLO: beyond efficient YOLOv5 for PCB defect detection

Year: 2024

Type: conference-abstract

Source: International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE)

DOI: 10.1117/12.3033433

Authors: Yiming Zhao, Zhanhong Zhong, Wenhao Lin, Ge Tian, Jiwei Tang, Na Wang

Institution: Jinan University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403467603

Cites:

Cited by:

Related to: 10