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High-temperature ADC peripheral circuit design and system performance testing

Year: 2024

Type: conference-abstract

Source: International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE)

DOI: 10.1117/12.3033400

Authors: Zhenyu Lin, Xiaodong Cao

Institutions: Liaocheng University, Chinese Academy of Sciences, Institute of Semiconductors, University of Chinese Academy of Sciences

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403467644

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