A YOLO-based defect detection system for printed circuit boards
Year: 2024
Type: conference-paper
DOI: 10.1117/12.3034174
Authors: Shijie Li, Rui Wang, Yonghong Wang
Institutions: Beihang University, Hefei University of Technology
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403467952