Analysis of the Influence of Temperature on Turn-Off Stress Waves in SiC MOSFET Using Laser Doppler Vibrometry
Year: 2024
Type: article
Source: IEEE Sensors Journal
Authors: Yang Ping, Hongying He, Yunze He, Qiying Li, Longhai Tang, Xuefeng Geng, Jie Zhang, Shan Chang, Wei Lai, Zhenjun Zhang
Institutions: Hunan University, Chongqing University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G4801606222, G5546244066
OpenAlex ID: W4403510628